Single-event upset
Electronic fault caused by radiation
Single-event upset
A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (e.g. ions, electrons, photons) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). The error in device output or operation caused as a result of the strike is called an SEU or a soft error. The SEU itself is not considered permanently damaging to the transistors' or circuits' functionality, unlike the case of single-event latch-up (SEL), single-event gate rupture (SEGR), or single-event burnout (SEB). These are all examples of a general class of radiation effects in electronic devices called single-event effects (SEEs).
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